Volume 11, Issue 40 (summer 2007)                   JCPP 2007, 11(40): 157-165 | Back to browse issues page


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H. Mohammadi, M.Khodambashi Emami, A. Rezai. Estimation of Genetic Parameters for Wheat Grain Yield and its Components Using Diallel Crosses. JCPP. 2007; 11 (40) :157-165
URL: http://jcpp.iut.ac.ir/article-1-694-en.html

Abstract:   (20865 Views)
Half diallel crosses of nine Iranian wheat cultivars were used to estimate the general and specific combining ability effects and other genetic parameters related to yield and its components. Parents with F2 generations were evaluated at Research Farm, College of Agriculture, University of Shahrekord, in a randomized complete block design with 3 replications. Partitioning of genotypes mean squares to GCA and SCA mean squares based on Griffing’s method 2 and mixed model indicated high significant differences among cultivars in their GCA values for all traits. There were significant differences among crosses in their SCA values for all traits except for flag leaf length, main spike length, plant height and grain yield per plant. The high ratio of GCA to SCA mean squares implied the importance of additive gene effects in the appearance of flag leaf length , main spike length, plant height and grain yield per plant. For flag leaf width, grain number per main spike and peduncle length , the contributions of additive gene effects and for peduncle weight, the contributions of non- additive gene effects were higher. According to the estimates of average degree of dominance, the gene actions for flag leaf length, flag leaf width, plant height, grain yield per plant, main spike length, peduncle length and peduncle weight were partial dominance. The GCA effects indicated that Sefid – Aliabad cultivar was the suitable general combiner for flag leaf length , flag leaf width, plant height , grain yield per plant , main spike length and peduncle length.
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Type of Study: Research | Subject: General

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